@Article{OliveiraLobMar:2012:InSiIn,
author = "Oliveira, Deiler Antonio Lima and {Evaldo Jos{\'e} Corat} and
{Vladimir Jesus Trava-Airoldi} and Lobo, Anderson Oliveira and
Marciano, Fernanda Roberta",
affiliation = "{} and {Instituto Nacional de Pesquisas Espaciais (INPE)} and
{Instituto Nacional de Pesquisas Espaciais (INPE)} and
{Universidade do Vale do Para{\'{\i}}ba - Univap} and
{Universidade do Vale do Para{\'{\i}}ba - Univap}",
title = "Influence of the silicon interlayer on diamond-like carbon films
deposited on glass substrates",
journal = "Revista UNIVAP",
year = "2012",
volume = "18",
number = "31",
pages = "112 - 121",
abstract = "Diamond-like carbon (DLC) films as a hard protective coating have
achieved great success in a diversity of technological
applications. However, adhesion of DLC films to substrates can
restrict their applications. The influence of a silicon interlayer
in order to improve DLC adhesion on glass substrates was
investigated. Amorphous silicon interlayer and DLC films were
deposited using plasma enhanced chemical vapor deposition from
silane and methane, respectively. The bonding structure,
transmittance, refraction index, and adherence of the films were
also evaluated regarding the thickness of the silicon interlayer.
Raman scattering spectroscopy did not show any substantial
difference in DLC structure due to the interlayer thickness of the
silicon. Optical measurements showed a sharp decrease of
transmittance in the ultra-violet region caused by the fundamental
absorption of the light. In addition, the absorption edge of
transmittance shifted toward longer wavelength side in the
ultra-violet region as the thickness of the silicon interlayer
increased. The tribological results showed an increase of DLC
adherence as the silicon interlayer increased, which was
characterized by less cracks around the grooves.",
issn = "1517-3275",
language = "en",
targetfile = "50-483-1-PB.pdf",
urlaccessdate = "01 maio 2024"
}